ASTM F1192-11(2018)

ASTM F1192-11(2018)

Name in English:
ASTM F1192-11(2018)

Name in Russian:
ASTM F1192-11(2018)

Description in English:
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Description in Russian:
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Document status:
Active

Format:
Electronic (PDF)

Page count:
11

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days

SKU:
ASTM10558

Choose Document Language:
$12
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