ASTM F76-08(2016)e1

ASTM F76-08(2016)e1

Name in English:
ASTM F76-08(2016)e1

Name in Russian:
ASTM F76-08(2016)e1

Description in English:
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Description in Russian:
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

Document status:
Active

Format:
Electronic (PDF)

Page count:
14

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
7 business days

SKU:
ASTM12396

Choose Document Language:
$8
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