IEC 60147-2K:1978

IEC 60147-2K:1978

Name in English:
IEC 60147-2K:1978

Name in Russian:
МЭК 60147-2K:1978

Description in English:
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods.

Description in Russian:
Основные номинальные параметры и характеристики полупроводниковых приборов и общие принципы измерений. Часть 2. Общие принципы измерений

Document status:
Replaced

Format:
Electronic (pdf/doc)

Page count:
55

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
6 business days

SKU:
IEC011070

Choose Document Language:
$15
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