IEC 60191-2:1966/Amd.17:2008

IEC 60191-2:1966/Amd.17:2008

Name in English:
IEC 60191-2:1966/Amd.17:2008

Name in Russian:
МЭК 60191-2:1966/Изм.17:2008

Description in English:
Mechanical standardization of semiconductor devices - Part 2: Dimensions. Amendment 17

Description in Russian:
Стандартизация конструкций полупроводниковых приборов. Часть 2. Размеры. Изменение 17

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
3 business days


Choose Document Language:
Need Help?

Customers who bought this item also bought

IEC 62453-315:2016
Field device tool (FDT) Interface specification - Part 315: Communication profile integration - IEC 61784 CPF 15
IEC 61298-3:2008
Process measurement and control devices - General methods and procedures for evaluating performance - Part 3: Tests for the effects of influence quantities
IEC 60746-3:2002
Expression of performance of electrochemical analyzers - Part 3 : Electrolytic conductivity
IEC 62239-1:2018
Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan
IEC 60068-2-66:1994
Environmental testing - Part 2: Test methods - Test Cx: Damp heat, steady state (unsaturated pressurized vapour)
IEC 60704-2-4:2011
Household and similar electrical appliances - Test code for the determination of airborne acoustical noise - Part 2-4: Particular requirements for washing machines and spin extractors