IEC 60749-1:2002

IEC 60749-1:2002

Name in English:
IEC 60749-1:2002

Name in Russian:
МЭК 60749-1:2002

Description in English:
Semiconductor devices. Mechanical and climatic test methods. Part 1. General

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 1. Общие положения

Document status:
Active

Format:
Electronic (PDF)

Page count:
18

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
3 business days

SKU:
IEC003915

Choose Document Language:
$10
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