IEC 60749-19:2003/Amd.1:2010

IEC 60749-19:2003/Amd.1:2010

Name in English:
IEC 60749-19:2003/Amd.1:2010

Name in Russian:
МЭК 60749-19:2003/Изм.1:2010

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength. Amendment 1

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 19. Прочность кристалла на сдвиг. Изменение 1

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
8

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC012481

Choose Document Language:
$15
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