IEC 60749-19:2010

IEC 60749-19:2010

Name in English:
IEC 60749-19:2010

Name in Russian:
МЭК 60749-19:2010

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 19. Прочность кристалла на сдвиг

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Electronic (PDF)

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Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days


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