IEC 60749-2:2002

IEC 60749-2:2002

Name in English:
IEC 60749-2:2002

Name in Russian:
МЭК 60749-2:2002

Description in English:
Semiconductor devices - Mechanical and climatic test methods. Part 2. Low air pressure

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 2. Пониженное атмосферное давление

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
14

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC009651

Choose Document Language:
$15
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