IEC 60749-2:2002

IEC 60749-2:2002

Name in English:
IEC 60749-2:2002

Name in Russian:
МЭК 60749-2:2002

Description in English:
Semiconductor devices - Mechanical and climatic test methods. Part 2. Low air pressure

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 2. Пониженное атмосферное давление

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days


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