IEC 60749-20:2008

IEC 60749-20:2008

Name in English:
IEC 60749-20:2008

Name in Russian:
МЭК 60749-20:2008

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 20. Сопротивление поверхностно монтируемых устройств в пластмассовом корпусе совместному воздействию влажности и теплоты, выделяемой при пайке

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
53

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
6 business days

SKU:
IEC011384

Choose Document Language:
$50
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