IEC 60749-27:2006/Amd.1:2012

IEC 60749-27:2006/Amd.1:2012

Name in English:
IEC 60749-27:2006/Amd.1:2012

Name in Russian:
МЭК 60749-27:2006/Изм.1:2012

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM). Amendment 1

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 27. Испытание на чувствительность к электростатическому разряду. Машинная модель. Изменение 1

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
10

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC013803

Choose Document Language:
$15
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