IEC 60749-27:2012

IEC 60749-27:2012

Name in English:
IEC 60749-27:2012

Name in Russian:
МЭК 60749-27:2012

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 27. Испытание на чувствительность к электростатическому разряду. Механическая модель

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
3 business days


Choose Document Language:
Need Help?

Customers who bought this item also bought

IEC 60512-16-1:2008
Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
IEC 60064:2005
Tungsten filament lamps for domestic and similar general lighting purposes - Performance requirements
IEC 60335-2-32:2013
Household and similar electrical appliances - Safety - Part 2-32: Particular requirements for massage appliances
IEC/TR 61334-1-4:1995
Distribution automation using distribution line carrier systems - Part 1: General considerations - Section 4: Identification of data transmission parameters concerning medium and low-voltage distribution mains
IEC 62232:2017
Determination of RF field strength, power density and SAR in the vicinity of radiocommunication base stations for the purpose of evaluating human exposure
IEC 62386-222:2018
Digital addressable lighting interface - Part 222: Particular requirements for control gear - Thermal lamp protection (device type 21)