IEC 60749-29:2011

IEC 60749-29:2011

Name in English:
IEC 60749-29:2011

Name in Russian:
МЭК 60749-29:2011

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 29. Испытание на "защелкивание"

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
52

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
6 business days

SKU:
IEC012919

Choose Document Language:
$15
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