IEC 60749-34:2010

IEC 60749-34:2010

Name in English:
IEC 60749-34:2010

Name in Russian:
МЭК 60749-34:2010

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 34. Маневренный режим мощности

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
3 business days


Choose Document Language:
Need Help?

Customers who bought this item also bought

IEC 61076-1:2006
Connectors for electronic equipment - Product requirements - Part 1: Generic specification
IEC 61143-2:1992
Electrical measuring instruments; X-t recorders; part 2: recommended additional test methods
IEC 60748-11:1990/Amd.1:1995
Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits; Amendment 1
IEC 60331-31:2002
Tests for electric cables under fire conditions. Circuit integrity. Part 31. Procedures and requirements for fire with shock. Cables of rated voltage up to and including 0,6/1 kV
IEC 60050-692:2017
International electrotechnical vocabulary - Part 692: Generation, transmission and distribution of electrical energy - Dependability and quality of service of electric power systems
IEC 60679-2:1981
Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators