IEC 60749-37:2008

IEC 60749-37:2008

Name in English:
IEC 60749-37:2008

Name in Russian:
МЭК 60749-37:2008

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

Description in Russian:
Приборы полупроводниковые. Механические и климатические методы испытания. Часть 37. Метод испытания на удар печатных плат при падении с номинального уровня с помощью акселерометра

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
44

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
5 business days

SKU:
IEC009540

Choose Document Language:
$15
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