IEC 60749-38:2008

IEC 60749-38:2008

Name in English:
IEC 60749-38:2008

Name in Russian:
МЭК 60749-38:2008

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 38. Метод испытания на сбой для полупроводниковых устройств с памятью

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
3 business days


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