IEC 60749-4:2002

IEC 60749-4:2002

Name in English:
IEC 60749-4:2002

Name in Russian:
МЭК 60749-4:2002

Description in English:
Semiconductor devices - Mechanical and climatic test methods. Part 4. Damp heat, steady state, highly accelerated stress tests (HAST)

Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 4. Высокоускоренные испытания в утяжеленном установившемся режиме, вызванным влажным теплом (HAST)

Document status:
Replaced

Format:
Electronic (pdf/doc)

Page count:
18

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC009769

Choose Document Language:
$15
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