IEC 60749-40:2011

IEC 60749-40:2011

Name in English:
IEC 60749-40:2011

Name in Russian:
МЭК 60749-40:2011

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

Description in Russian:
Полупроводниковые приборы. Методы климатических и механических испытаний. Часть 40. Метод испытания на падение с бортового уровня с использованием датчика деформаций

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
5 business days


Choose Document Language:
Need Help?

Customers who bought this item also bought

IEC 60633:2015
Terminology for high-voltage direct current (HVDC) transmission
IEC 60034-14:2018
Rotating electrical machines - Part 14: Mechanical vibration of certain machines with shaft heights 56 mm and higher - Measurement, evaluation and limits of vibration severity
IEC/TR 60664-2-1:2011
Insulation coordination for equipment within low-voltage systems - Part 2-1: Application guide - Explanation of the application of the IEC 60664 series, dimensioning examples and dielectric testing
IEC 60050-102:2007/Amd.1:2017
International electrotechnical vocabulary - Part 102: Mathematics - General concepts and linear algebra. Amendment 1
IEC 60214-1:2014
Tap-changers - Part 1: Performance requirements and test methods
IEC 62541-10:2015
OPC Unified Architecture - Part 10: Programs