IEC 60749-40:2011

IEC 60749-40:2011

Name in English:
IEC 60749-40:2011

Name in Russian:
МЭК 60749-40:2011

Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

Description in Russian:
Полупроводниковые приборы. Методы климатических и механических испытаний. Часть 40. Метод испытания на падение с бортового уровня с использованием датчика деформаций

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
48

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
5 business days

SKU:
IEC013056

Choose Document Language:
$15
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