Name in English:
IEC 60749-7:2011
Name in Russian:
МЭК 60749-7:2011
Description in English:
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Description in Russian:
Приборы полупроводниковые. Методы механических и климатических испытаний. Часть 7. Измерение внутреннего содержания влаги и анализ других остаточных газов
Document status:
Active
Format:
Electronic (PDF)
Page count:
26
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
3 business days
SKU:
IEC002887
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