IEC 60759:1983/Amd.1:1991

IEC 60759:1983/Amd.1:1991

Name in English:
IEC 60759:1983/Amd.1:1991

Name in Russian:
МЭК 60759:1983/Изм.1:1991

Description in English:
Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

Description in Russian:
Спектрометры полупроводниковые энергии рентгеновского излучения. Стандартные методы испытаний. Изменение 1

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
6

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC009914

Choose Document Language:
$15
Need Help?

Customers who bought this item also bought

IEC 60169-1:1987/Amd.1:1996
Radio-frequency connectors - Part 1: General requirements and measuring methods; Amendment 1

Regular Price: $50

Special Price $15

IEC 60079-1:1971/Amd.1:1979
Electrical apparatus for explosive gas atmospheres. Part 1 : Construction and test of flameproof enclosures of electrical apparatus

Regular Price: $50

Special Price $15

IEC 60839-11-31:2016
Alarm and electronic security systems - Part 11-31: Electronic access control systems - Core interoperability protocol based on Web services

Regular Price: $300

Special Price $90

IEC 60809:1985
Lamps for road vehicles. Dimensional, electrical and luminous requirements

Regular Price: $50

Special Price $15

IEC 61196-1-116:2015
Coaxial communication cables - Part 1-116: Electrical test methods - Test for impedance with time domain reflectometry (TDR)

Regular Price: $50

Special Price $15

IEC 60079-19:2015
Explosive atmospheres - Part 19: Equipment repair, overhaul and reclamation

Regular Price: $50

Special Price $15