IEC 60759:1983/Amd.1:1991

IEC 60759:1983/Amd.1:1991

Name in English:
IEC 60759:1983/Amd.1:1991

Name in Russian:
МЭК 60759:1983/Изм.1:1991

Description in English:
Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1

Description in Russian:
Спектрометры полупроводниковые энергии рентгеновского излучения. Стандартные методы испытаний. Изменение 1

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days


Choose Document Language:
Need Help?

Customers who bought this item also bought

IEC 60724:2008
Short-circuit temperature limits of electric cables with rated voltages of 1 kV (Um = 1,2 kV) and 3 kV (Um = 3,6 kV)
IEC 60803:1984/Amd.1:1995
Recommended dimensions for hexagonal and square crimping-die cavities, indentors, gauges, outer conductor crimp sleeves and centre contact crimp barrels for r.f. cables and connectors; Amendment 1
IEC 61915-2:2011
Low-voltage switchgear and controlgear - Device profiles for networked industrial devices - Part 2: Root device profiles for starters and similar equipment
IEC/TS 62462:2017
Ultrasonics - Output test - Guidance for the maintenance of ultrasound physiotherapy systems
IEC 61291-6-1:2008
Optical amplifiers - Part 6-1: Interfaces - Command set
IEC 61156-3-2:2001
Multicore and symmetrical pair/quad cables for digital communications. Part 3-2. Work area wiring. Capability Approval. Sectional specifications