IEC 62047-10:2011/Cor.1:2012

IEC 62047-10:2011/Cor.1:2012

Name in English:
IEC 62047-10:2011/Cor.1:2012

Name in Russian:
МЭК 62047-10:2011/Попр.1:2012

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials. Corrigendum 1

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 10. Испытание на сжатие микро - колонн для материалов микроэлектромеханических систем MEMS. Поправка 1

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
1

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC013479

Choose Document Language:
$5
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