IEC 62047-10:2011/Cor.1:2012

IEC 62047-10:2011/Cor.1:2012

Name in English:
IEC 62047-10:2011/Cor.1:2012

Name in Russian:
МЭК 62047-10:2011/Попр.1:2012

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials. Corrigendum 1

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 10. Испытание на сжатие микро - колонн для материалов микроэлектромеханических систем MEMS. Поправка 1

Document status:
Active

Format:
Electronic (PDF)

Page count:
1

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
2 business days

SKU:
IEC005636

Choose Document Language:
$8
Need Help?

Customers who bought this item also bought

IEC 60094-11:1988
Magnetic tape sound recording and reproducing systems. Part 11: Address code for compact cassettes
$12
IEC/TR 61431:1995
Guide for the use of monitor systems for lead-acid traction batteries
$12
IEC 60398:2015
Installations for electroheating and electromagnetic processing - General performance test methods
$12
IEC 60068-2-5:2018
Environmental testing - Part 2-5: Tests - Test S: Simulated solar radiation at ground level and guidance for solar radiation testing and weathering
$12
IEC/TR 61912-1:2007
Low-voltage switchgear and controlgear - Overcurrent protective devices - Part 1: Application of short-circuit ratings
$12
IEC 60050-702:1992/Cor.1:1992
International electrotechnical vocabulary; chapter 702: oscillations, signals and related devices. Corrigendum 1
$8