IEC 62047-12:2011

IEC 62047-12:2011

Name in English:
IEC 62047-12:2011

Name in Russian:
МЭК 62047-12:2011

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 12. Метод испытания на усталость при сгибании тонкопленочных материалов с использованием структур MEMS

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
64

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
7 business days

SKU:
IEC013211

Choose Document Language:
$15
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