IEC 62047-12:2011

IEC 62047-12:2011

Name in English:
IEC 62047-12:2011

Name in Russian:
МЭК 62047-12:2011

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 12. Метод испытания на усталость при сгибании тонкопленочных материалов с использованием структур MEMS

Document status:
Active

Format:
Electronic (PDF)

Page count:
64

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
7 business days

SKU:
IEC005638

Choose Document Language:
$12
Need Help?

Customers who bought this item also bought

IEC 61029-2-8:1995/Amd.2:2001
Safety of transportable motor-operated electric tools - Part 2-8: Particular requirements for single spindle vertical molders
$8
IEC 61000-6-1:2016
Electromagnetic compatibility (EMC) - Part 6-1: Generic standards - Immunity standard for residential, commercial and light-industrial environments
$12
IEC 60269-3:2013
Low-voltage fuses - Part 3: Supplementary requirements for fuses for use by unskilled persons (fuses mainly for household or similar applications) - Examples of standardized systems of fuses A to F
$25
IEC/TR 63100:2017
Transmitting equipment for radiocommunication - Radio-over-fibre technologies for spectrum measurement - 100-GHz spectrum measurement equipment
$12
IEC 60630:2005
Maximum lamp outlines for incandescent lamps
$15
IEC 62149-9:2014
Fibre optic active components and devices - Performance standards - Part 9: Seeded reflective semiconductor optical amplifier transceivers
$12