IEC 62047-13:2012

IEC 62047-13:2012

Name in English:
IEC 62047-13:2012

Name in Russian:
МЭК 62047-13:2012

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 13. Методы измерения прочности сцепления при испытании на изгиб и сдвиг микроэлектромеханических структур MEMS

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
34

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days

SKU:
IEC013464

Choose Document Language:
$15
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