IEC 62047-13:2012

IEC 62047-13:2012

Name in English:
IEC 62047-13:2012

Name in Russian:
МЭК 62047-13:2012

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures

Description in Russian:
Полупроводниковые приборы. Микроэлектромеханические приборы. Часть 13. Методы измерения прочности сцепления при испытании на изгиб и сдвиг микроэлектромеханических структур MEMS

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
5 business days


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