IEC 62047-8:2011

IEC 62047-8:2011

Name in English:
IEC 62047-8:2011

Name in Russian:
МЭК 62047-8:2011

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

Description in Russian:
Полупроводниковые приборы. Микро-электро-механические приборы. Часть 8. Методы испытания на осевую усталость тонкопленочных материалов

Document status:
Active

Format:
Electronic (pdf/doc)

Page count:
40

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days

SKU:
IEC012867

Choose Document Language:
$15
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