IEC 62374-1:2010

IEC 62374-1:2010

Name in English:
IEC 62374-1:2010

Name in Russian:
МЭК 62374-1:2010

Description in English:
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Description in Russian:
Полупроводниковые приборы. Часть 1. Испытание на пробой диэлектрика в зависимости от времени (TDDB) для интерметаллических слоев

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days


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