IEC 62418:2010

IEC 62418:2010

Name in English:
IEC 62418:2010

Name in Russian:
МЭК 62418:2010

Description in English:
Semiconductor devices - Metallization stress void test

Description in Russian:
Полупроводниковые приборы. Определение объема пустот при металлизации

Document status:
Active

Format:
Electronic (PDF)

Page count:
38

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days

SKU:
IEC006224

Choose Document Language:
$12
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