ISO 14237:2000

ISO 14237:2000

Name in English:
ISO 14237:2000

Name in Russian:
ИСО 14237:2000

Description in English:
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Description in Russian:
Химический анализ поверхности. Масс-спектрометрия вторичных ионов. Определение атомной концентрации бора в кремнии с помощью однородно легированных материалов

Document status:
Replaced

Format:
Electronic (pdf/doc)

Page count:
28

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
0 business day

SKU:
ISO002995

Choose Document Language:
$15
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