ISO 15470:2004

ISO 15470:2004

Name in English:
ISO 15470:2004

Name in Russian:
ИСО 15470:2004

Description in English:
Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Description in Russian:
Химический анализ поверхности. Рентгеновская спектроскопия с фотоэлектрической регистрацией. Описание выборных рабочих параметров прибора

Document status:
Replaced

Format:
Electronic (pdf/doc)

Page count:
12

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
0 business day

SKU:
ISO000141

Choose Document Language:
$50
Need Help?

Customers who bought this item also bought

ISO 3694:1977
Ammonium sulphate for industrial use; Determination of chloride ions content; Potentiometric method
$50
ISO 3892:2000
Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods
$50
ISO 5246:1977
Textile machinery and accessories; Ringless weft pirns (24 mm and 27 mm) for automatic winding at the loom
$30
ISO 13291:2006
Zinc sulfide concentrates -- Determination of zinc -- Solvent extraction and EDTA titrimetric method
$50
ISO/IEC 9171-1:1990
Information technology; 130 mm optical disk cartridge, write once, for information interchange; part 1: unrecorded optical disk cartridge
$50
ISO/TS 211:2014
Essential oils -- General rules for labelling and marking of containers
$50