St ISO 14237:2000

St ISO 14237:2000

Name in English:
St ISO 14237:2000

Name in Russian:
Ст ИСО 14237:2000

Description in English:
Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Description in Russian:
Химический анализ поверхности. Масс-спектрометрия вторичных ионов. Определение атомной концентрации бора в кремнии с помощью однородно легированных материалов

Document status:

Electronic (pdf/doc)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
4 business days


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