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Discrete semiconductor devices and integrated circuits. Optoelectronic devices - Measuring methods. Original standard BS EN 60747-5-3-2001 (2003) in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - General. Original standard BS EN 60749-1-2003 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Rapid change of temperature. Two-fluid-bath method. Original standard BS EN 60749-11-2002 (2003) in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Robustness of terminations (lead integrity). Original standard BS EN 60749-14-2003 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Particle impact noise detection (PIND). Original standard BS EN 60749-16-2003 (2004) in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Die shear strength. Original standard BS EN 60749-19-2003 + A1-2010 in PDF full version. Additional info + preview on request

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