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Semiconductor devices. Mechanical and climatic test methods - Internal moisture content measurement and the analysis of other residual gases. Original standard BS EN 60749-7-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Sealing. Original standard BS EN 60749-8-2003 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Permanence of marking. Original standard BS EN 60749-9-2017 in PDF full version. Additional info + preview on request

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Aerospace series. Static seal elements O-Ring ethylene- propylene, moulded, phosphate ester resistant (- 55 °C to 107 °C). Inch series. Original standard BS EN 6075-2017 in PDF full version. Additional info + preview on request

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Test on gases evolved during combustion of materials from cables - Determination of the halogen acid gas content. Original standard BS EN 60754-1-2014 + A1-2020 in PDF full version. Additional info + preview on request

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Test on gases evolved during combustion of materials from cables - Determination of acidity (by pH measurement) and conductivity. Original standard BS EN 60754-2-2014 + A1-2020 in PDF full version. Additional info + preview on request

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