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Semiconductor devices - Magnetic and capacitive coupler for basic and reinforced insulation. Original standard BS EN IEC 60747-17-2020 (2021) in PDF full version. Additional info + preview on request

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Semiconductor devices - Optoelectronic devices. Photocouplers. Original standard BS EN IEC 60747-5-5-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Mechanical shock. device and subassembly. Original standard BS EN IEC 60749-10-2022 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency. Original standard BS EN IEC 60749-12-2018 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere. Original standard BS EN IEC 60749-13-2018 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through-hole mounted devices. Original standard BS EN IEC 60749-15-2020 in PDF full version. Additional info + preview on request

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