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Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature. Original standard BS IEC 60747-14-11-2021 in PDF full version. Additional info + preview on request

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Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors - Hall elements. Original standard BS IEC 60747-14-2-2000 in PDF full version. Additional info + preview on request

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Semiconductor devices - Semiconductor sensors. Pressure sensors. Original standard BS IEC 60747-14-3-2009 in PDF full version. Additional info + preview on request

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Semiconductor devices. Discrete devices - Semiconductor accelerometers. Original standard BS IEC 60747-14-4-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices - Semiconductor sensors. PN-junction semiconductor temperature sensor. Original standard BS IEC 60747-14-5-2010 in PDF full version. Additional info + preview on request

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Semiconductor devices - Microwave integrated circuits. Frequency prescalers. Original standard BS IEC 60747-16-2-2001 (2007) in PDF full version. Additional info + preview on request

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