Electromagnetic compatibility (EMC). Part 4-29. Testing and measurement techniques. Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
State system for ensuring the uniformity of measurements. Standard reference data. Silicide of vanadium. The lattice parameters in the concentration range from 20 at.% to 25 at.% of silicon. Coefficient of linear thermal expansion in the range from 20 K up to 300 K