GOST R 71334-2024

Name in English:
GOST R 71334-2024

Name in Russian:
ГОСТ Р 71334-2024

Description in English:

Epitaxial structures. Мethod for measuring the thickness of epitaxial silicon layers in structures of the silicon-on-sapphire type based on IR interference

Description in Russian:
Структуры эпитаксиальные. Метод измерения толщины эпитаксиальных слоев кремния в структурах типа кремний на сапфире на основе инфракрасной интерференции

Document status:

Active

Format:

Electronic (PDF)

Page count:

8

Delivery time (for English version):

2 business days

Delivery time (for Russian version):

1 business day

SKU:

GOST49426

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