Russian standards PDF
Microwave ferrite devices. Method of measurement of isolation of tree-port circulator at high power level
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Electro-optical elements. Method of measuring the initial constant phase delay
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Piezoelectric resonators. Methods of measuring dynamic resistance in the range of ambient temperatures during operation
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Active elements of gas lasers. Method of gain measurement
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Microwave ferrite devices. Methods of measurement of voltage standing wave ratio at low power level
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The epitaxial structures and dielectric films. Method for measuring the thickness of gallium arsenide epitaxial layers based on a spherical section
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