Name in English:
St IEC 62047-18:2013
Name in Russian:
Ст МЭК 62047-18:2013
Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
Description in Russian:
Приборы полупроводниковые. Микроэлектромеханические приборы. Часть 18. Метод испытания на изгиб тонкопленочных материалов
Document status:
Active
Format:
Electronic (PDF)
Page count:
30
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
5 business days
SKU:
Stc008179
Customers who bought this item also bought
St ASTM B640-12a
Standard Specification for Welded Copper Tube for Air Conditioning and Refrigeration Service
$8
St ISO 2910:2007
Cinematography -- Screen luminance and chrominance for the projection of motion pictures
$10
St ISO 10121-2:2013
Test methods for assessing the performance of gas-phase air cleaning media and devices for general ventilation -- Part 2: Gas-phase air cleaning devices (GPACD)
$10
St ASTM F2385-15(2019)
Standard Practice for Determining Femoral Head Penetration into Acetabular Components of Total Hip Replacement Using Clinical Radiographs
$8
