St IEC 62047-18:2013

St IEC 62047-18:2013

Name in English:
St IEC 62047-18:2013

Name in Russian:
Ст МЭК 62047-18:2013

Description in English:
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

Description in Russian:
Приборы полупроводниковые. Микроэлектромеханические приборы. Часть 18. Метод испытания на изгиб тонкопленочных материалов

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
5 business days


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