IEC 62132-1-2015 PDF

Full title and description

IEC 62132-1:2015 — Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions. This international standard defines general conditions, definitions, test equipment, test setups, test procedures and required test-report content that apply to the IEC 62132 series for quantifying the electromagnetic (RF) immunity of integrated circuits (ICs) to conducted and radiated disturbances.

Abstract

IEC 62132-1:2015 is the normative, introductory part of the IEC 62132 series. It provides the common framework and definitions used by the measurement methods described in the subsequent parts of the series. The document specifies general test conditions, instrumentation, DUT configuration and monitoring, measurement parameters, performance classes and reporting requirements, and includes comparison tables (Annex A) to assist in selecting the appropriate measurement method. This edition updates and clarifies the previous (2006) edition and modifies several normative elements (for example changes to frequency treatment and IC performance classes).

General information

• Status: Published — current edition (active, normative for the IEC 62132 series)
• Publication date: 29 October 2015
• Publisher: IEC — International Electrotechnical Commission (TC 47 / SC 47A)
• ICS / categories: 31.200 (Integrated circuits. Microelectronics; Electromagnetic compatibility)
• Edition / version: Edition 2.0 (2015)
• Number of pages: 49 pages

Scope

This part provides general information and definitions for measurement of electromagnetic immunity of integrated circuits (ICs) to both conducted and radiated disturbances. It establishes the common test conditions, required test equipment and setup, DUT mounting and monitoring, measurement procedures and the required information for test reports that apply across the IEC 62132 series. Annex A contains test-method comparison tables to help choose the most appropriate measurement method. The 2015 edition removed the explicit “150 kHz to 1 GHz” range from the title/scope and updated frequency-step and performance-class provisions to accommodate broader measurement needs.

Key topics and requirements

• Definitions and terminology for IC immunity measurement (common terms used across the series).
• General test conditions: supply and control voltages, ambient and shielding conditions, and DUT operating modes.
• Test equipment and measurement chain requirements (generators, amplifiers, antennas, TEM cells, probes, terminations and monitoring equipment).
• Standardized DUT mounting, PCB/test-board practices and cabling/layout considerations to ensure repeatability.
• Measurement procedures and steps to obtain repeatable quantitative immunity results (including injected voltages/currents and monitoring of DUT response).
• IC performance classes and criteria for reporting immunity levels.
• Content and format requirements for test reports to allow comparison between methods and laboratories.
• Annex A: comparison tables that map test methods to typical applications and measurement attributes.

Typical use and users

This standard is used by semiconductor manufacturers, EMC test laboratories, quality and compliance engineers, device designers, test-equipment manufacturers and R&D groups to establish repeatable procedures for measuring and reporting the RF immunity of integrated circuits. It is used to select appropriate measurement methods, interpret comparative results, design test fixtures/PCBs and produce standardized test reports for internal qualification, supplier assessment and regulatory or customer-facing documentation.

Related standards

IEC 62132-1 is the foundational part of the IEC 62132 series. Other related parts in the series include (non-exhaustive): IEC 62132-2 (TEM and wideband TEM cell radiated-immunity method), IEC 62132-3 (bulk current injection, BCI), IEC 62132-4 (direct RF power injection), IEC 62132-5 (workbench Faraday cage method), IEC 62132-8 (IC stripline method) and IEC TS/62132-9 (supporting guidance / technical specifications). IEC 62132 series methods are often used alongside general immunity standards such as IEC 61000-4-3 (radiated RF immunity) and IEC 61000-4-6 (conducted RF immunity) when correlating component-level and system-level immunity results. Regional/adopted versions (EN/EVS etc.) exist for national implementation.

Keywords

IEC 62132-1, integrated circuits, IC, electromagnetic immunity, EMC, radiated immunity, conducted immunity, TEM cell, BCI, RF injection, test methods, test procedures, test setup, IC performance classes, test report

FAQ

Q: What is this standard?

A: IEC 62132-1:2015 is Part 1 of the IEC 62132 series and provides general conditions, definitions and requirements for measuring the electromagnetic (RF) immunity of integrated circuits. It sets the common framework used by the measurement methods in the other parts of the series.

Q: What does it cover?

A: It covers terminology, general test and environmental conditions, required test equipment and setup, DUT mounting and monitoring, measurement procedures, IC performance classes and the required content of test reports. Annex A provides comparison tables to help select measurement methods.

Q: Who typically uses it?

A: Semiconductor manufacturers, EMC and component test laboratories, compliance and quality engineers, device/PCB designers and test-equipment vendors use this standard to design and perform repeatable IC immunity tests and to prepare standardized test reports.

Q: Is it current or superseded?

A: The 2015 edition (Edition 2.0) is the current published edition of IEC 62132-1, published on 29 October 2015. The previous (2006) edition was withdrawn on 29 October 2015. The IEC webstore lists a stability date into the late 2020s for the 2015 edition, indicating it remains the normative version until formally updated or replaced.

Q: Is it part of a series?

A: Yes. IEC 62132-1 is the general part of the IEC 62132 series (measurement of electromagnetic immunity of integrated circuits). Other parts in the series describe specific measurement methods (TEM cell, BCI, RF injection, Faraday‑cage, stripline, etc.) and supporting technical specifications.

Q: What are the key keywords?

A: Integrated circuits, electromagnetic immunity, EMC testing, radiated immunity, conducted immunity, TEM cell, BCI, RF injection, test procedures, IC performance classes, test report.