St IEC 62374:2007

St IEC 62374:2007

Name in English:
St IEC 62374:2007

Name in Russian:
Ст МЭК 62374:2007

Description in English:
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Description in Russian:
Полупроводниковые приборы. Испытание на пробой диэлектрика в зависимости от времени (TDDB) для управляющих диэлектрических пленок

Document status:
Active

Format:
Electronic (PDF)

Page count:
46

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
7 business days

SKU:
Stc009014

Choose Document Language:
$12
Need Help?
Special offer: Suggest price that will satisfy you and we change it!

Customers who bought this item also bought

St ASTM D7693/D7693M-15
Standard Guide for Application of Heat Weldable Modified Bituminous Waterproofing Membranes Systems for New Concrete Decks
$8
St ISO 619:1981
Manganese ores; Determination of chromium content; Diphenylcarbazide photometric method and silver persulphate titrimetric method
$10
St ISO 8588:1987
Sensory analysis; Methodology; 'A' - 'not A' test
$10
St ASTM D1631-10(2018)e1
Standard Test Method for Water in Phenol and Related Materials by the Iodine Reagent Method
$8
St ISO 15349-2:1999
Unalloyed steel - Determination of low carbon content - Part 2: Infrared absorption method after combustion in an induction furnace (with preheating)
$10
St ISO 5843-3:1997
Aerospace - List of equivalent terms - Part 3: Aerospace bolts and nuts
$10