Name in English:
St IEC 62374:2007
Name in Russian:
Ст МЭК 62374:2007
Description in English:
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Description in Russian:
Полупроводниковые приборы. Испытание на пробой диэлектрика в зависимости от времени (TDDB) для управляющих диэлектрических пленок
Document status:
Active
Format:
Electronic (PDF)
Page count:
46
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
7 business days
SKU:
Stc009014
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