St IEC 62374:2007

St IEC 62374:2007

Name in English:
St IEC 62374:2007

Name in Russian:
Ст МЭК 62374:2007

Description in English:
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Description in Russian:
Полупроводниковые приборы. Испытание на пробой диэлектрика в зависимости от времени (TDDB) для управляющих диэлектрических пленок

Document status:

Electronic (PDF)

Page count:

Delivery time (for English version):
1 business day

Delivery time (for Russian version):
7 business days


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