BS IEC 62396-2-2017 PDF

Full title and description

BS IEC 62396-2:2017 — Process management for avionics. Atmospheric radiation effects. Part 2: Guidelines for single event effects testing for avionics systems. This publication provides guidance for testing electronic components and assemblies to determine their susceptibility to single event effects (SEE) induced by atmospheric neutrons and explains how to convert test results to estimated SEE rates for avionics applications.

Abstract

Guidance on obtaining and performing single event effects (SEE) testing for electronic components and boards used in avionics, including recommended test considerations, types of radiation sources, and methods to convert laboratory test outcomes into estimates of in-service SEE rates at aircraft altitudes. While developed for avionics, the methods are applicable to other industries concerned with atmospheric radiation effects on electronics.

General information

• Status: Current / Active (BS adoption; definitive).
• Publication date: BS adoption published 11 January 2018 (original IEC publication 15 December 2017).
• Publisher: British Standards Institution (BSI) — adoption of IEC publication (IEC as original publisher).
• ICS / categories: 03.100.50, 31.020, 49.060 (Production management; Electronic components; Aerospace electrical equipment).
• Edition / version: Edition 2.0 (IEC 62396-2:2017).
• Number of pages: 42 pages (IEC official publication page).

Scope

Provides practical guidance for planning and performing SEE tests (including choice of test method and radiation source), gathering and interpreting SEE data, and converting measured test results into predicted SEE rates for avionics systems at flight altitudes. The scope covers component- and board-level testing, use of existing SEE data, and considerations needed to support avionics assurance and qualification activities; the guidance is intended primarily for the avionics industry but may be applied elsewhere.

Key topics and requirements

• Definitions and terminology for single event effects (SEE) relevant to avionics.
• Guidance on obtaining SEE data (literature, test databases and prior results).
• Recommended considerations for planning and performing SEE tests (test conditions, flux, energy spectra, DUT handling).
• Methods to convert laboratory test results (from different sources) into estimated in-service SEE rates at aircraft altitudes.
• Use of test data in system safety assessments and avionics reliability cases.
• Annex/bibliography listing historic SEE data sources and reference test methods.

Typical use and users

Primary users are avionics designers, qualification and reliability engineers, test laboratories performing SEE characterization, certification specialists preparing evidence for airworthiness, and suppliers of electronic components for aerospace. Secondary users include radiation-effects researchers, system integrators, and organizations in other industries (e.g., high-altitude platforms, satellites, ground systems with similar radiation concerns) that need SEE testing guidance.

Related standards

Part of the IEC/BS IEC 62396 series addressing atmospheric radiation effects for avionics. Key related parts include IEC/BS IEC 62396-1 (Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment), IEC 62396-3 (System design optimisation to accommodate SEE), IEC 62396-4 (High-voltage aircraft electronics design guidance), and additional parts/technical reports (for example Part 6 on extreme space weather). These parts are intended to be used together to develop a complete process and design assurance approach for atmospheric radiation effects in avionics systems.

Keywords

single event effects, SEE testing, atmospheric neutrons, avionics, radiation effects, soft error rate, single event latch-up, component testing, reliability, qualification, IEC 62396, BSI adoption.

FAQ

Q: What is this standard?

A: It is the British adoption (BS IEC 62396-2:2017) of IEC 62396-2:2017 — guidance for single event effects (SEE) testing of electronic components and boards intended for avionics applications.

Q: What does it cover?

A: It covers procedures and considerations for obtaining SEE data, planning and performing SEE tests using various radiation sources, interpreting results, and converting test outcomes into estimated in-service SEE rates for aircraft altitudes to support design and certification.

Q: Who typically uses it?

A: Avionics designers, test laboratories, component and board suppliers, reliability and certification engineers, and researchers dealing with atmospheric radiation effects on electronics.

Q: Is it current or superseded?

A: The 2017 edition (BS IEC 62396-2:2017 / IEC 62396-2:2017) is the current edition replacing earlier PAS/TS documents (PAS 62396-2:2007 and IEC TS 62396-2:2008). The IEC publication is dated December 2017 and the BS adoption was published January 11, 2018. The IEC record lists this edition as the active international standard (stability indicated through 2028 on the IEC catalogue).

Q: Is it part of a series?

A: Yes — it is Part 2 of the multi-part IEC/BS IEC 62396 series on process management for avionics — atmospheric radiation effects. Other parts address accommodation, system design, high-voltage design, thermal neutron assessment, and related technical reports.

Q: What are the key keywords?

A: Single event effects (SEE), atmospheric neutrons, SEE testing, avionics reliability, radiation-induced soft errors, single event latch-up (SEL), soft error rate (SER), component qualification, IEC 62396.