DIN EN ISO 9220 1995-01 PDF

Full title and description

DIN EN ISO 9220:1995-01 — Metallic coatings — Measurement of coating thickness — Scanning electron microscope method. This is the German adoption of EN ISO 9220 (based on ISO 9220:1988) describing a scanning electron microscope (SEM) technique for measuring the thickness of metallic coatings, with guidance on sample preparation, calibration and measurement practice.

Abstract

Provides a quantitative method using scanning electron microscopy to determine coating thickness by examining suitable cross-sections (or alternative SEM approaches), specifying calibration procedures, measurement conditions and reporting conventions. The 1995 DIN/EN adoption corresponds to the earlier ISO text and has since been withdrawn and replaced by a modernised ISO/EN edition.

General information

• Status: Withdrawn / superseded (replaced by DIN EN ISO 9220:2022).
• Publication date: 1995-01 (January 1995).
• Publisher: Deutsches Institut für Normung (DIN) — German adoption of EN ISO 9220.
• ICS / categories: 25.220.40 (metallic coatings); older records for related editions also reference class entries used for coatings and surface engineering.
• Edition / version: DIN EN ISO 9220:1995-01 (German version of EN ISO 9220:1994 / ISO 9220:1988).
• Number of pages: 8 pages (original DIN/EN publication).

Scope

Specifies a procedure for measuring the thickness of metallic and related inorganic coatings using a scanning electron microscope. It covers required specimen preparation (typically cross-sectioning and metallographic mounting), SEM imaging and calibration routines, selection of measurement locations, and basic precision/accuracy considerations for SEM-based thickness determinations. The 1995 edition implements the ISO 9220 methodology later modernised in the 2022 revision.

Key topics and requirements

• Principle of SEM-based measurement of coating thickness (cross-sectional imaging and measurement).
• Specimen preparation: sectioning, mounting, polishing to expose coating/substrate interface.
• SEM imaging and parameter selection (magnification, accelerating voltage, working distance) that affect accuracy.
• Calibration and use of reference standards or scale calibration in the SEM.
• Reporting: measurement locations, number of readings, statistical treatment and uncertainty considerations.
• Limitations and considerations for different coating/substrate systems (conductivity, topography, multilayers).

Typical use and users

Used by metallurgical and surface-analysis laboratories, quality-control departments in plating and surface‑treatment industries, research groups in materials science and by inspection bodies that require microscopic, high-resolution thickness data (for thin or multilayer metallic coatings where destructive cross-sectioning and SEM are appropriate). SEM measurement is typically applied when non‑destructive gauges are unsuitable (very thin layers, complex multilayers, or when cross-sectional microstructure must also be assessed).

Related standards

Standards commonly referenced alongside ISO/DIN EN ISO 9220 include ISO 2178 (magnetic methods for coating thickness), ISO 2360 (eddy-current methods), ISO 2808 (paints and varnishes — film thickness determination including cross‑section/wedge methods) and other metallographic and plating standards (references to ISO 1463 and related plating/coating test standards appear in later revisions and informative annexes). These provide complementary (non‑destructive or alternative destructive) measurement methods and test practices.

Keywords

Scanning electron microscope, SEM, coating thickness, metallic coatings, cross‑section, calibration, DIN EN ISO 9220, ISO 9220:1988, withdrawn, superseded (2022).

FAQ

Q: What is this standard?

A: DIN EN ISO 9220:1995-01 is the German (DIN) adoption of EN ISO 9220 / ISO 9220 describing a scanning electron microscope (SEM) method for measuring the thickness of metallic coatings.

Q: What does it cover?

A: It covers procedures for preparing specimens (usually cross‑sections), imaging them in an SEM, calibrating the measurement scale and reporting thickness values and associated measurement considerations for metallic coatings and similar inorganic layers.

Q: Who typically uses it?

A: Metallography and surface‑analysis laboratories, plating and coating quality teams, materials researchers and inspection bodies that need microscopic, high‑resolution thickness measurements or combined thickness/microstructure information.

Q: Is it current or superseded?

A: The 1995 DIN EN ISO 9220 edition is withdrawn and has been superseded by a more recent edition (DIN EN ISO 9220 / ISO 9220:2022). Users should refer to the 2022 edition for the current, updated requirements and precision/annex data.

Q: Is it part of a series?

A: It belongs to the family of standards addressing coating measurement and testing (ISO/TC 107 work on metallic and inorganic coatings) and is commonly used in conjunction with other thickness‑measurement standards (e.g., ISO 2178, ISO 2360, ISO 2808) and metallographic testing norms.

Q: What are the key keywords?

A: SEM, scanning electron microscope, coating thickness, metallic coatings, cross‑sectioning, calibration, DIN EN ISO 9220, ISO 9220, withdrawn, superseded.