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Semiconductor devices. Mechanical and climatic test methods - Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat. Original standard UNE-EN IEC 60749-20-2020 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Preconditioning of non-hermetic surface mount devices prior to reliability testing. Original standard UNE-EN IEC 60749-30-2020 in PDF full version. Additional info + preview on request

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Optical fibres - Part 1-22- Measurement methods and test procedures - Length measurement. Original standard UNE-EN IEC 60793-1-22-2025 in PDF full version. Additional info + preview on request

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Optical fibres - Attenuation measurement methods. Original standard UNE-EN IEC 60793-1-40-2025 in PDF full version. Additional info + preview on request

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Optical fibres - Part 1-44- Measurement methods and test procedures - Cut-off wavelength. Original standard UNE-EN IEC 60793-1-44-2024 in PDF full version. Additional info + preview on request

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Optical fibres - Part 1-46- Measurement methods and test procedures - Monitoring of changes in attenuation. Original standard UNE-EN IEC 60793-1-46-2025 in PDF full version. Additional info + preview on request

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