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Semiconductor devices - Mechanical and climatic test methods - Bond strength - Wire bond shear test methods. Original standard UNE-EN IEC 60749-22-2-2026 in PDF full version. Additional info + preview on request

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Semiconductor devices - Mechanical and climatic test methods - Part 7- Internal moisture content measurement and the analysis of other residual gases. Original standard UNE-EN IEC 60749-7-2026 in PDF full version. Additional info + preview on request

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Optical amplifiers - Test methods - Part 1-2- Power and gain parameters - Electrical spectrum analyzer method. Original standard UNE-EN IEC 61290-1-2-2026 in PDF full version. Additional info + preview on request

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Amendment - Radiation protection instrumentation - Measurement of personal dose equivalents for X, gamma, neutron and beta radiations - Active personal dosemeters. Original standard UNE-EN IEC 61526-2026 in PDF full version. Additional info + preview on request

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Low voltage surge protective devices - Part 21- Surge protective devices connected to telecommunications and signalling networks - Requirements and test methods. Original standard UNE-EN IEC 61643-21-2026 in PDF full version. Additional info + preview on request

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Fibre optic sensors - Part 8-1- Pressure measurement - Pressure sensors based on fibre Bragg gratings. Original standard UNE-EN IEC 61757-8-1-2026 in PDF full version. Additional info + preview on request

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