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Semiconductor devices. Mechanical and climatic test methods - Solderability. Original standard BS EN 60749-21-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Bond strength. Original standard BS EN 60749-22-2003 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - High temperature operating life. Original standard BS EN 60749-23-2004 + A1-2011 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Accelerated moisture resistance. Unbiased HAST. Original standard BS EN 60749-24-2004 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Temperature cycling. Original standard BS EN 60749-25-2003 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Electrostatic discharge (ESD) sensitivity testing. Machine model (MM). Original standard BS EN 60749-27-2006 + A1-2012 in PDF full version. Additional info + preview on request

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