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Nanomanufacturing. Key control characteristics - Two-dimensional materials. Carrier concentration- Field effect transistor method. Original standard PD IEC TS 62607-6-16-2022 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Graphene-based material. Domain size- substrate oxidation. Original standard PD IEC TS 62607-6-3-2020 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key Control Characteristics - Nano-enabled metal-oxide interfacial devices. Analogue resistance change and resistance fluctuation- Electrical resistance measurement. Original standard PD IEC TS 62607-8-3-2023 in PDF full version. Additional info + preview on request

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Nanomanufacturing. Key control characteristics - Metal-oxide interfacial devices. Activation energy of electronic trap states- Low-frequency-noise spectroscopy. Original standard PD IEC TS 62607-8-4-2024 in PDF full version. Additional info + preview on request

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Optical backplanes. Product specification - Optical backplane using optical fibre circuit boards and multi-core right angle optical connectors. Original standard PD IEC TS 62661-2-1-2013 in PDF full version. Additional info + preview on request

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Measurement procedures for materials used in photovoltaic modules - Adhesion testing for PV module laminates using the single cantilevered beam (SCB) method. Original standard PD IEC TS 62788-6-3-2022 in PDF full version. Additional info + preview on request

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