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Semiconductor devices. Mechanical and climatic test methods - Ionizing radiation (total dose). Original standard UNE-EN IEC 60749-18-2019 in PDF full version. Additional info + preview on request

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Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices. Original standard UNE-EN IEC 60749-41-2020 in PDF full version. Additional info + preview on request

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Installations for electroheating and electromagnetic processing. Test methods for electroslag remelting furnaces. Original standard UNE-EN IEC 60779-2020 in PDF full version. Additional info + preview on request

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Optical fibres - Measurement methods and test procedures. Tensile strength. Original standard UNE-EN IEC 60793-1-31-2019 in PDF full version. Additional info + preview on request

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Optical fibres - Part 1-32- Measurement methods and test procedures - Coating strippability. Original standard UNE-EN IEC 60793-1-32-2019 in PDF full version. Additional info + preview on request

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Optical fibres - Measurement methods and test procedures. Differential mode delay. Original standard UNE-EN IEC 60793-1-49-2018 in PDF full version. Additional info + preview on request

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