ASTM F1153-92 (2002) PDF
Name in English:
St ASTM F1153-92 (2002)
Name in Russian:
Ст ASTM F1153-92 (2002)
Description in English:
Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003). Original standard ASTM F1153-92 (2002) in PDF full version. Additional info + preview on request
Description in Russian:
Стандартный метод определения характеристик структур металл-оксид-кремний (MOS) по вольт-фарадным измерениям (отменён в 2003 г.). Оригинальный стандарт ASTM F1153-92 (2002) в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Withdrawn
Format:
Electronic (PDF)
Page count:
7
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
stastm15063
More technical details are being prepared for this document.