ASTM F613-93 PDF
Name in English:
St ASTM F613-93
Name in Russian:
Ст ASTM F613-93
Description in English:
Test Method for Measuring Diameter of Semiconductor Wafers (Withdrawn 2001). Original standard ASTM F613-93 in PDF full version. Additional info + preview on request
Description in Russian:
Метод измерения диаметра полупроводниковых пластин (отменён в 2001 году). Оригинальный стандарт ASTM F613-93 в PDF полная версия. Дополнительная инфо + превью по запросу
Document status:
Withdrawn
Format:
Electronic (PDF)
Page count:
5
Delivery time (for English version):
1 business day
Delivery time (for Russian version):
2 business days
SKU:
stastm17821
More technical details are being prepared for this document.