State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer

Description in Russian:
Государственная система обеспечения единства измерений. Размерные параметры наночастиц и тонких пленок. Методика выполнения измерений с помощью малоуглового рентгеновского дифрактометра

Document status:

Active

Format:

Electronic (PDF)

Page count:

Delivery time (for English version):

4 business days

Delivery time (for Russian version):

1 business day

SKU:

GOST38719

GOST R 8.698-2010

State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer

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