STM PDF

Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003). Original standard ASTM F398-92 (2002) in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002). Original standard ASTM F399-00a in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes (Withdrawn 2010). Original standard ASTM F4-66 (2005) in PDF full version. Additional info + preview on request

Document status: Withdrawn

Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988). Original standard ASTM F40-83 in PDF full version. Additional info + preview on request

Document status: Withdrawn

Standard Consumer Safety Specification for Lighters. Original standard ASTM F400-20 (2024) in PDF full version. Additional info + preview on request

Document status: Active

Method of Test for Yield and Maintenance Factors for Gaskets (Withdrawn 1978). Original standard ASTM F401-74 in PDF full version. Additional info + preview on request

Document status: Replaced by St ASTM F586-79 (1989)e1