STM PDF

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St ASTM F526-21

Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines. Original standard ASTM F526-21 in PDF full version. Additional info + preview on request

Document status: Active

€15
St ASTM F527-80 (1991)e1

Practice for Adjusting Photoresist Exposure Time (Withdrawn 1996). Original standard ASTM F527-80 (1991)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

€15
St ASTM F528-99 (2005)

Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011). Original standard ASTM F528-99 (2005) in PDF full version. Additional info + preview on request

Document status: Withdrawn

€15
St ASTM F529-80 (1987)e1

Method for Interpretation of Interferograms of Nominally Plane Wavefronts (Withdrawn 1994). Original standard ASTM F529-80 (1987)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

€15
St ASTM F532-81 (1987)e1

Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994). Original standard ASTM F532-81 (1987)e1 in PDF full version. Additional info + preview on request

Document status: Withdrawn

€15
St ASTM F533-02a

Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003). Original standard ASTM F533-02a in PDF full version. Additional info + preview on request

Document status: Withdrawn

€15
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